Table of Contents

FAME instruments and techniques

This page describes the types of instruments and techniques used to measure the spectra appearing in SSHADE. Description items are here as they are in the SSHADE description. More details can be found on the beamlines webpages: BM30 - FAME and BM16 - FAME-UHD.

XAS measurements in transmission mode on BM30

BM30 transmission

XAS measurements in fluorescence mode on BM30

bm30b-trans-fluo.jpg

BM30 fluorescence

  • Type: X-ray absorption spectrometer
  • Name: X-ray Absorption Spectroscopy measured in fluorescence mode
  • Technique: fluorescence emission
  • Comments: High diluted station in macro beam 0.3×0.2mm2 (HxV). Fluorescence of the sample measured with a Canberra 30 elements solid-state detector. The X-rays scattered by a fixed path of air are measured with Si diodes to obtain the incident intensity.
  • Source: synchrotron - bending magnet
  • Source wavelength: hard X
  • Spectral analyzer(s): 2-crystal monochromator Si[220]
  • Detector(s): solid-state Ge detector

XAS measurements in high resolution mode, with crystal analyser spectrometer on BM30B

bm30b-trans-cas.jpg

BM30B HERFD Ge[110]

  • Type: X-ray absorption spectrometer
  • Name: High Energy Resolution Fluorescence Detection X-ray Absorption Spectroscopy
  • Technique: fluorescence emission
  • Comments: High diluted station in macro beam 0.3×0.2mm2 (HxV). The X-rays scattered by a fixed path of air are measured with Si diodes to obtain the incident intensity.
  • Source: synchrotron - bending magnet
  • Source wavelength: hard X
  • Spectral analyzer(s): 2-crystal monochromator Si[220]
  • Detector(s): Ge [110] analyser crystals (1m spherically bent) + Si drift diode

And other available reflections on the same model: Si[880] (Si[110] 1m spherically bent) and Si[444] (Si[111] 0.5m spherically bent).

XAS measurements in high resolution mode, with crystal analyser spectrometer on BM16

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BM16 HERFD Ge[100]

  • Type: X-ray absorption spectrometer
  • Name: High Energy Resolution Fluorescence Detection X-ray Absorption Spectroscopy
  • Technique: fluorescence emission
  • Comments: High diluted station in macro beam 0.25×0.15mm2 (HxV). The X-rays scattered by a fixed path of air are measured with Si diodes to obtain the incident intensity.
  • Source: synchrotron - bending magnet
  • Source wavelength: hard X
  • Spectral analyzer(s): 2-crystal monochromator Si[220]
  • Detector(s): Ge [100] analyser crystals (1m spherically bent) + Si drift diode

And the other available reflections on the same model: Ge[110], Ge[111], Ge[331], Ge[422], Ge[620], Si[100], Si[111], Si[220].