sshade:databases:fame:instruments [SSHADE]

This page describes the types of instruments and techniques used to measure the spectra appearing in SSHADE. Description items are here as they are in the SSHADE description. More details can be found on the beamlines webpages: BM30 - FAME and BM16 - FAME-UHD.

BM30 transmission

Type: X-ray absorption spectrometer
Name: X-ray Absorption Spectroscopy measured in transmission mode
Technique: transmission
Comments: High diluted station in macro beam 0.3×0.2mm2 (HxV). Measurement with Si diodes of the x-rays scattered by a fixed path of air.
Source: synchrotron - bending magnet
Source wavelength: hard X
Spectral analyzer(s): 2-crystal monochromator Si[220]
Detector(s): Si diodes

BM30 fluorescence

Type: X-ray absorption spectrometer
Name: X-ray Absorption Spectroscopy measured in fluorescence mode
Technique: fluorescence emission
Comments: High diluted station in macro beam 0.3×0.2mm2 (HxV). Fluorescence of the sample measured with a Canberra 30 elements solid-state detector. The X-rays scattered by a fixed path of air are measured with Si diodes to obtain the incident intensity.
Source: synchrotron - bending magnet
Source wavelength: hard X
Spectral analyzer(s): 2-crystal monochromator Si[220]
Detector(s): solid-state Ge detector

BM30B HERFD Ge[110]

Type: X-ray absorption spectrometer
Name: High Energy Resolution Fluorescence Detection X-ray Absorption Spectroscopy
Technique: fluorescence emission
Comments: High diluted station in macro beam 0.3×0.2mm2 (HxV). The X-rays scattered by a fixed path of air are measured with Si diodes to obtain the incident intensity.
Source: synchrotron - bending magnet
Source wavelength: hard X
Spectral analyzer(s): 2-crystal monochromator Si[220]
Detector(s): Ge [110] analyser crystals (1m spherically bent) + Si drift diode

And other available reflections on the same model: Si[880] (Si[110] 1m spherically bent) and Si[444] (Si[111] 0.5m spherically bent).

BM16 HERFD Ge[100]

Type: X-ray absorption spectrometer
Name: High Energy Resolution Fluorescence Detection X-ray Absorption Spectroscopy
Technique: fluorescence emission
Comments: High diluted station in macro beam 0.25×0.15mm2 (HxV). The X-rays scattered by a fixed path of air are measured with Si diodes to obtain the incident intensity.
Source: synchrotron - bending magnet
Source wavelength: hard X
Spectral analyzer(s): 2-crystal monochromator Si[220]
Detector(s): Ge [100] analyser crystals (1m spherically bent) + Si drift diode

And the other available reflections on the same model: Ge[110], Ge[111], Ge[331], Ge[422], Ge[620], Si[100], Si[111], Si[220].

FAME instruments and techniques

XAS measurements in transmission mode on BM30

XAS measurements in fluorescence mode on BM30

XAS measurements in high resolution mode, with crystal analyser spectrometer on BM30B

XAS measurements in high resolution mode, with crystal analyser spectrometer on BM16

SSHADE